IAR Systems I-jet In-Circuit Debugging Probe for ARM
IAR Systems I-jet™ In-Circuit Debugging Probe for ARM is a slim JTAG hardware debug probe designed for simplified, seamless, and more flexible development workflows. It connects via USB to the PC host running Windows and is fully plug-and-play compatible. I-jet integrates seamlessly into the high-performing C/C++ compiler and debugger tool suite IAR Embedded Workbench® IDE for easy-to-use, fast, and reliable debugging. It offers support for microcontrollers based on ARM7™, ARM9™, ARM11™, ARM® Cortex™-M, ARM Cortex-R4, and ARM Cortex-A5/A8/A9 cores. I-jet features automatic core recognition, and direct download into the flash memory of the most popular microcontrollers. It has the capability of measuring target power consumption with a high degree of accuracy.
I-jet provides a fast and stable debugging platform with download speeds of up to 1MB/sec, JTAG and Serial Wire Debug (SWD) clocking at up to 35MHz, and Serial Wire Output (SWO) frequencies of up to 100MHz. It can supply the target boards with power and is entirely powered by USB. The Serial Wire Viewer (SWV) is supported using the UART and Manchester encoding modes. Embedded Trace Buffer (ETB) and JTAG adaptive clocking are supported and all JTAG signals can be monitored.
IAR Systems I-Scope Probe
The I-scope is a small probe that adds current and voltage measurement capabilities to the I-jet. The measurements can be done at any designated points on the target board and are displayed in real-time by the C-SPY Debugger in IAR Embedded Workbench for ARM.
- I-scope measures current and voltages and sends it to I-jet, which synchronizes the data with the program counter of the running application.
- The data can be graphed and profiled in real time and analyzed using the C-SPY Debugger in IAR Embedded Workbench for ARM.
- The current sensing is done by connecting two differential current measurement leads across a shunt resistor on the target board.
- The power analysis can for example be used to:
- Reveal the power consumption of individual functions and peripherals
- Identify I/O activities that cause current spikes
- Diagnose low power mode
- Investigate MCU frequency and core voltage power savings
- Find conflicting hardware setup
- Reduce RF emissions by identifying and eliminating unwanted current spikes
- Measure and compare battery consumption in various MCU sleep modes
- I+ and I- differential voltage, 110mV full scale across shunt resistor
- One differential current channel, 0-6V common mode
- Three voltage channels, 0-6V
- Sampling rate up to 200 kHz with 12 bit resolution
- Includes a MIPI-20 flat cable for attaching to the I-jet
- Includes 6 flying test leads and 6 grabbers
- Supports all ARM cores
- I-scope is used in combination with I-jet